Keyword : Pockels effect


Pre-Equalizing Electro-Optic Modulator Utilizing Polarization-Reversed Ferro-Electric Crystal Substrate
Hiroshi MURATA Tomohiro OHNO Takayuki MITSUBO Atsushi SANADA 
Publication:   
Publication Date: 2018/07/01
Vol. E101-C  No. 7 ; pp. 581-585
Type of Manuscript:  INVITED PAPER (Special Section on Distinguished Papers in Photonics)
Category: 
Keyword: 
optical modulatorPockels effectpolarization reversalimpulse responseequalization
 Summary | Full Text:PDF(1.2MB)

Optical Magnetic Field Probe with a Loop Antenna Element Doubly Loaded with LiNbO3 Crystals
Eiji SUZUKI Satoru ARAKAWA Hiroyasu OTA Ken Ichi ARAI Risaburo SATO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/11/01
Vol. E87-C  No. 11 ; pp. 1989-1996
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
Keyword: 
probeloop antennaelectro-optic crystalelectromagnetic near-fieldPockels effect
 Summary | Full Text:PDF(1MB)

Wevelength Upconversion Demultiplexer Using Beam Deflection by Pockels Effect
Kojiro KOYANAGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/11/25
Vol. E80-C  No. 11 ; pp. 1499-1502
Type of Manuscript:  LETTER
Category: Opto-Electronics
Keyword: 
wavelength demultiplexerquasi-phase-matched sum-frequency-generationoptical deflectorPockels effectlithium niobate
 Summary | Full Text:PDF(255.5KB)

Electro-Optic Testing Technology for High-Speed LSIs
Tadao NAGATSUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/04/25
Vol. E79-C  No. 4 ; pp. 482-488
Type of Manuscript:  INVITED PAPER (Special Issue on Ultra-High-Speed LSIs)
Category: 
Keyword: 
electro-opticsPockels effectsamplingpulse lasertesting
 Summary | Full Text:PDF(775.9KB)

Measurement of High-Speed Devices and Integrated Circuits Using Electro-Optic Sampling Technique
Tadao NAGATSUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/01/25
Vol. E76-C  No. 1 ; pp. 55-63
Type of Manuscript:  INVITED PAPER (Special Issue on Opto-Electronics and LSI)
Category: Opto-Electronics Technology for LSIs
Keyword: 
electro-opticsPockels effectsamplingpulse laserIC testing
 Summary | Full Text:PDF(869.2KB)