Keyword : On chip monitoring


Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation
Takuya SAWADA Taku TOSHIKAWA Kumpei YOSHIKAWA Hidehiro TAKATA Koji NII Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4 ; pp. 586-593
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
SRAMImmunityOn chip monitoringBuilt-in self testing
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