| Keyword : NBTI
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Stress Probability Computation for Estimating NBTI-Induced Delay Degradation Hiroaki KONOURA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A
No. 12 ;
pp. 2545-2553
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis Keyword: NBTI, stress probability, timing analysis, | | Summary | Full Text:PDF(1.4MB) | |
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