IEICE Trans

Keyword : NBTI

Identification and Application of Invariant Critical Paths under NBTI Degradation Song BIAN Shumpei MORITA Michihiro SHINTANI Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO
Publication: Publication Date: 2017/12/01 Vol. E100-A No. 12 ; pp. 2797-2806 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: NBTI, aging effect, invariant critical path, processor,
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Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation Hiromitsu AWANO Takashi SATO
Publication: Publication Date: 2017/12/01 Vol. E100-A No. 12 ; pp. 2807-2815 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: failure probability calculation, NBTI, Monte Carlo, subset simulation, augmented reliability,
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Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/07/01 Vol. E99-A No. 7 ; pp. 1400-1409 Type of Manuscript: Special Section PAPER (Special Section on Design Methodologies for System on a Chip) Category: Keyword: NBTI, reliability, static timing analysis, timing characterization, aging-aware timing library,
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Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/07/01 Vol. E99-A No. 7 ; pp. 1390-1399 Type of Manuscript: Special Section PAPER (Special Section on Design Methodologies for System on a Chip) Category: Keyword: SRAM cell yield, failure probability calculation, NBTI, importance sampling, particle filter, Monte Carlo method,
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NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time Hiroaki KONOURA Toshihiro KAMEDA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2014/07/01 Vol. E97-A No. 7 ; pp. 1483-1491 Type of Manuscript: Special Section PAPER (Special Section on Design Methodologies for System on a Chip) Category: Keyword: NBTI, NBTI mitigation, performance degradation, scan path, aging, reliability,
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Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs Jae-Hyung JANG Hyuk-Min KWON Ho-Young KWAK Sung-Kyu KWON Seon-Man HWANG Jong-Kwan SHIN Seung-Yong SUNG Yi-Sun CHUNG Da-Soon LEE Hi-Deok LEE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2013/05/01 Vol. E96-C No. 5 ; pp. 624-629 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: fluorine, flicker noise, 1/f noise, reliability, hot-carrier, NBTI, MOSFET,
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Stress Probability Computation for Estimating NBTI-Induced Delay Degradation Hiroaki KONOURA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2011/12/01 Vol. E94-A No. 12 ; pp. 2545-2553 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Device and Circuit Modeling and Analysis Keyword: NBTI, stress probability, timing analysis,
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Short Term Cell-Flipping Technique for Mitigating SNM Degradation Due to NBTI Yuji KUNITAKE Toshinori SATO Hiroto YASUURA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2011/04/01 Vol. E94-C No. 4 ; pp. 520-529 Type of Manuscript: Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration) Category: Keyword: NBTI, SRAM, static noise margin, stress probability, register file, cache memory,
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A Dynamic Continuous Signature Monitoring Technique for Reliable Microprocessors Makoto SUGIHARA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2011/04/01 Vol. E94-C No. 4 ; pp. 477-486 Type of Manuscript: Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration) Category: Keyword: soft error, NBTI, SEU, SET, control signal error, continuous signature monitoring, reliability, vulnerability, microprocessor,
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All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter Tetsuya IIZUKA Jaehyun JEONG Toru NAKURA Makoto IKEDA Kunihiro ASADA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2011/04/01 Vol. E94-C No. 4 ; pp. 487-494 Type of Manuscript: Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration) Category: Keyword: process variability, all digital, on-chip monitor, buffer ring, NBTI, PBTI,
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Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels Takashi ITO Xiaoli ZHU Shin-Ichiro KUROKI Koji KOTANI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2010/11/01 Vol. E93-C No. 11 ; pp. 1638-1644 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: nanograting, current drive, effective mobility, reliability, TDDB, NBTI,
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