Keyword : NBTI


Identification and Application of Invariant Critical Paths under NBTI Degradation
Song BIAN Shumpei MORITA Michihiro SHINTANI Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12 ; pp. 2797-2806
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
NBTIaging effectinvariant critical pathprocessor
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Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation
Hiromitsu AWANO Takashi SATO 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12 ; pp. 2807-2815
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
failure probability calculationNBTIMonte Carlosubset simulationaugmented reliability
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Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability
Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/07/01
Vol. E99-A  No. 7 ; pp. 1400-1409
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTIreliabilitystatic timing analysistiming characterizationaging-aware timing library
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Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling
Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/07/01
Vol. E99-A  No. 7 ; pp. 1390-1399
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
SRAM cell yieldfailure probability calculationNBTIimportance samplingparticle filterMonte Carlo method
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NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time
Hiroaki KONOURA Toshihiro KAMEDA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7 ; pp. 1483-1491
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTINBTI mitigationperformance degradationscan pathagingreliability
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Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs
Jae-Hyung JANG Hyuk-Min KWON Ho-Young KWAK Sung-Kyu KWON Seon-Man HWANG Jong-Kwan SHIN Seung-Yong SUNG Yi-Sun CHUNG Da-Soon LEE Hi-Deok LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5 ; pp. 624-629
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
fluorineflicker noise1/f noisereliabilityhot-carrierNBTIMOSFET
 Summary | Full Text:PDF

Stress Probability Computation for Estimating NBTI-Induced Delay Degradation
Hiroaki KONOURA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A  No. 12 ; pp. 2545-2553
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
NBTIstress probabilitytiming analysis
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Short Term Cell-Flipping Technique for Mitigating SNM Degradation Due to NBTI
Yuji KUNITAKE Toshinori SATO Hiroto YASUURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4 ; pp. 520-529
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
NBTISRAMstatic noise marginstress probabilityregister filecache memory
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A Dynamic Continuous Signature Monitoring Technique for Reliable Microprocessors
Makoto SUGIHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4 ; pp. 477-486
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
soft errorNBTISEUSETcontrol signal errorcontinuous signature monitoringreliabilityvulnerabilitymicroprocessor
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All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter
Tetsuya IIZUKA Jaehyun JEONG Toru NAKURA Makoto IKEDA Kunihiro ASADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4 ; pp. 487-494
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
process variabilityall digitalon-chip monitorbuffer ringNBTIPBTI
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Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels
Takashi ITO Xiaoli ZHU Shin-Ichiro KUROKI Koji KOTANI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/11/01
Vol. E93-C  No. 11 ; pp. 1638-1644
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
nanogratingcurrent driveeffective mobilityreliabilityTDDBNBTI
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