Keyword : NBTI mitigation


Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation
Shumpei MORITA Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   
Publication Date: 2017/07/01
Vol. E100-A  No. 7 ; pp. 1464-1472
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTI mitigationreliabilitytransistor agingperformance degradationinternal node control
 Summary | Full Text:PDF

NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time
Hiroaki KONOURA Toshihiro KAMEDA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7 ; pp. 1483-1491
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTINBTI mitigationperformance degradationscan pathagingreliability
 Summary | Full Text:PDF