Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2015/10/01 Vol. E98-ANo. 10 ;
pp. 2084-2090 Type of Manuscript: Special Section PAPER (Special Section on Recent Developments on Reliability, Maintainability and Dependability) Category: Keyword: lateral resupply between bases, queueing model, approximation method, availability, Monte Carlo simulation,
Theoretical Study on the Stability of the Single-Electron-Pump Refrigerator with Respect to Thermal and Dimensional Fluctuations Hiroya IKEDAFaiz SALLEH
Decomposition of Surface Data into Fractal Signals Based on Mean Likelihood and Importance Sampling and Its Applications to Feature Extraction Shozo TOKINAGANoboru TAKAGI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/03/01 Vol. E86-CNo. 3 ;
pp. 357-362 Type of Manuscript: Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02)) Category: Keyword: Monte Carlo simulation, molecular dynamics, mobility, screening, MOSFET,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/03/01 Vol. E86-CNo. 3 ;
pp. 350-356 Type of Manuscript: Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02)) Category: Keyword: Monte Carlo simulation, strained SiGe, low field electron mobility, doping and strain effects,
Increasing Importance of Electronic Thermal Noise in Sub-0.1 µm Si-MOSFETs Nobuyuki SANO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2000/08/25 Vol. E83-CNo. 8 ;
pp. 1203-1211 Type of Manuscript: INVITED PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99)) Category: Device Modeling and Simulation Keyword: Monte Carlo simulation, current fluctuation, thermal noise, shot noise, central limit theorem,
Atomic Scale Simulation of Extended Defects: Monte Carlo Approach Jaehee LEETaeyoung WON
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2000/08/25 Vol. E83-CNo. 8 ;
pp. 1253-1258 Type of Manuscript: Special Section PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99)) Category: Process Modeling and Simulation Keyword: extended defects, arsenic precipitation, Monte Carlo simulation, bimolecular kinetics,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2000/05/25 Vol. E83-ANo. 5 ;
pp. 812-817 Type of Manuscript: Special Section PAPER (Special Section on Reliability Theory and Its Applications) Category: Keyword: Monte Carlo simulation, fault tree analysis, sequential failure logic, minimal cut-AND structure,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/01/25 Vol. E81-CNo. 1 ;
pp. 36-41 Type of Manuscript: Special Section PAPER (Special Issue on Technology Challenges for Single Electron Devices) Category: Keyword: SET, photoirradiation, Monte Carlo simulation, photonic devices,