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A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs
Yueh-Hua WANG Ming-Hsiang CHO Lin-Kun WU | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2009/09/01
Vol. E92-C
No. 9 ;
pp. 1157-1162
Type of Manuscript:
Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies and Their Applications)
Category:
Keyword:
de-embedding, microwave, MOSFETs, noise, RF, silicon, | | | Summary | Full Text:PDF | |
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RF Analysis Methodology for Si and SiGe FETs Based on Transient Monte Carlo Simulation
Scott ROY Sava KAYA Asen ASENOV John R. BARKER | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2000/08/25
Vol. E83-C
No. 8 ;
pp. 1224-1227
Type of Manuscript:
Special Section PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99))
Category: Device Modeling and Simulation
Keyword:
device simulation, Monte Carlo, MOSFETs, RF, | | | Summary | Full Text:PDF | |
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KAYA