Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/09/01 Vol. E92-ANo. 9 ;
pp. 2376-2379 Type of Manuscript: LETTER Category: Reliability, Maintainability and Safety Analysis Keyword: MMICs, reliability, failure, accelerated testing, Weibull distribution, lognormal distribution,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2008/07/01 Vol. E91-CNo. 7 ;
pp. 1050-1057 Type of Manuscript: INVITED PAPER (Special Section on Heterostructure Microelectronics with TWHM 2007) Category: Keyword: HEMTs, HFETs, MMICs, InAs, InGaSb,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/09/01 Vol. E90-CNo. 9 ;
pp. 1695-1701 Type of Manuscript: Special Section PAPER (Special Section on Microwave and Millimeter-Wave Technology) Category: Active Devices/Circuits Keyword: switch, FET, FET resonator, millimeter-wave, high-power, low-loss, MMICs,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/06/25 Vol. E76-CNo. 6 ;
pp. 961-967 Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Technology for Advanced Functions and Size-Reductions) Category: Keyword: three-dimensional, passive elements, GaAs, MMICs,