Keyword : LUT (look-up table)


A 90 nm LUT Array for Speed and Yield Enhancement by Utilizing Within-Die Delay Variations
Kazuya KATSUKI Manabu KOTANI Kazutoshi KOBAYASHI Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/04/01
Vol. E90-C  No. 4 ; pp. 699-707
Type of Manuscript:  Special Section PAPER (Special Section on Low-Power, High-Speed LSIs and Related Technologies)
Category: Digital
Keyword: 
within-die variationreconfigurable deviceFPGALUT (look-up table)yield
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