Keyword : LSI tester


Algorithms for Digital Correction of ADC Nonlinearity
Haruo KOBAYASHI Hiroshi YAGI Takanori KOMURO Hiroshi SAKAYORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/02/01
Vol. E86-A  No. 2 ; pp. 504-508
Type of Manuscript:  LETTER
Category: Analog Signal Processing
Keyword: 
ADCnonlinearitydigital error correctiondigital signal processingLSI tester
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