Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2016/11/01 Vol. E99-DNo. 11 ;
pp. 2672-2681 Type of Manuscript: PAPER Category: Computer System Keyword: low power test, data compression, LFSR, X-filling,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2015/07/01 Vol. E98-CNo. 7 ;
pp. 594-596 Type of Manuscript: BRIEF PAPER Category: Keyword: error control code, parallel architecture, LFSR, BCH,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2008/07/01 Vol. E91-ANo. 7 ;
pp. 1824-1827 Type of Manuscript: LETTER Category: Cryptography and Information Security Keyword: stream cipher, LFSR, self-shrinking generator, guess-and-determine attack,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2004/12/01 Vol. E87-ANo. 12 ;
pp. 3318-3323 Type of Manuscript: Special Section LETTER (Special Section on VLSI Design and CAD Algorithms) Category: Test Keyword: BIST, test pattern generator, neighborhood pattern, LFSR, reseeding,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2003/12/01 Vol. E86-ANo. 12 ;
pp. 3063-3071 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Timing Verification and Test Generation Keyword: BIST, LFSR, test-per-clock, test-per-scan, seed, polynomial,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2003/12/01 Vol. E86-ANo. 12 ;
pp. 3056-3062 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Timing Verification and Test Generation Keyword: reseeding, LFSR, BIST, test pattern generation,
Exact Expected Test Length Generated by LFSRs for Circuits Containing Hard Random-Pattern-Resistant Faults Kazuhiko IWASAKIHiroyuki GOTO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1998/05/25 Vol. E81-ANo. 5 ;
pp. 885-888 Type of Manuscript: Special Section LETTER (Special Section on Discrete Mathematics and Its Applications) Category: Keyword: BIST, test length, random-pattern-resistant fault, LFSR, integer partition problem,