Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/02/01 Vol. E90-CNo. 2 ;
pp. 515-522 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: CMOSFET, reliability, LDD-type, channel width, isolation,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/09/01 Vol. E89-CNo. 9 ;
pp. 1351-1357 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: CMOSFET, LDD-type, source/drain-resistance, sheet resistance,