Keyword : IMD measurement

Design of Predistorter with Efficient Updating Algorithm of Power Amplifier with Memory Effect
Yasuyuki OISHI Shigekazu KIMURA Eisuke FUKUDA Takeshi TAKANO Daisuke TAKAGO Yoshimasa DAIDO Kiyomichi ARAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/03/01
Vol. E95-C  No. 3 ; pp. 382-394
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
power amplifier, IMD measurement, memory effect, bias impedance, predistorter, 
 Summary | Full Text:PDF
Iterative Determination of Phase Reference in IMD Measurement to Characterize Nonlinear Behavior, and to Derive Inverse, for Power Amplifier with Memory Effect
Yasuyuki OISHI Shigekazu KIMURA Eisuke FUKUDA Takeshi TAKANO Yoshimasa DAIDO Kiyomichi ARAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/10/01
Vol. E94-C  No. 10 ; pp. 1515-1523
Type of Manuscript:  Special Section PAPER (Special Section on Microwave and Millimeter-Wave Technology)
Category: Active Devices and Circuits
Keyword: 
power amplifier, IMD measurement, memory effect, bias impedance, predistorter, 
 Summary | Full Text:PDF
Efficient Method to Measure IMD of Power Amplifier with Simplified Phase Determination Procedure to Clarify Memory Effect Origins
Takeshi TAKANO Yasuyuki OHISHI Shigekazu KIMURA Michiharu NAKAMURA Kazuo NAGATANI Eisuke FUKUDA Yoshimasa DAIDO Kiyomichi ARAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/07/01
Vol. E93-C  No. 7 ; pp. 991-999
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies)
Category: 
Keyword: 
power amplifier, IMD measurement, memory effect, bias impedance, even order nonlinearity, 
 Summary | Full Text:PDF