Keyword : IDDQ sensor circuits


An IDDQ Sensor Driven by Abnormal IDDQ
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/10/25
Vol. E83-D  No. 10 ; pp. 1860-1867
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
built-in testingCMOS circuitsIDDQ sensor circuitsIDDQ testinglow-voltage ICs
 Summary | Full Text:PDF