Keyword : IC testing


Measurement of High-Speed Devices and Integrated Circuits Using Electro-Optic Sampling Technique
Tadao NAGATSUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/01/25
Vol. E76-C  No. 1 ; pp. 55-63
Type of Manuscript:  INVITED PAPER (Special Issue on Opto-Electronics and LSI)
Category: Opto-Electronics Technology for LSIs
Keyword: 
electro-opticsPockels effectsamplingpulse laserIC testing
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