Keyword : IC tester


A Timing Calibration Technique for High-Speed Memory Test
Mitsuhiro HAMADA Yasumasa NISHIMURA Mitsutaka NIIRO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/11/25
Vol. E75-C  No. 11 ; pp. 1377-1382
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memories)
Category: 
Keyword: 
timing calibrationIC testertiming accuracyhigh-speed memory testing
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