Keyword : I/O transistor


TCAD Driven Drain Engineering for Hot Carrier Reduction of 3.3 V I/O PMOSFET
Noriyuki MIURA Hirotaka KOMATSUBARA Marie MOCHIZUKI Hirokazu HAYASHI Koichi FUKUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C  No. 3 ; pp. 447-452
Type of Manuscript:  Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
Category: 
Keyword: 
hot carrier degradationI/O transistordrain avalanche hot carrierchannel hot holephoto-mask reduction
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