Keyword : FDSOI


Evaluation of Heavy-Ion-Induced Single Event Upset Cross Sections of a 65-nm Thin BOX FD-SOI Flip-Flops Composed of Stacked Inverters
Kentaro KOJIMA Kodai YAMADA Jun FURUTA Kazutoshi KOBAYASHI 
Publication:   
Publication Date: 2020/04/01
Vol. E103-C  No. 4 ; pp. 144-152
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: Electronic Circuits
Keyword: 
single event effectsoft errorheavy ion irradiationFDSOIflip flopdevice simulation
 Summary | Full Text:PDF(1.2MB)

A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process
Haruki MARUOKA Masashi HIFUMI Jun FURUTA Kazutoshi KOBAYASHI 
Publication:   
Publication Date: 2018/04/01
Vol. E101-C  No. 4 ; pp. 273-280
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
single event effectsoft errorα particleneutronheavy ionFDSOIflip-floplow-power consumption
 Summary | Full Text:PDF(1.4MB)