Keyword : EPROM


CMOS Process Compatible ie-Flash (Inverse Gate Electrode Flash) Technology for System-on-a Chip
Shoji SHUKURI Kazumasa YANAGISAWA Koichiro ISHIBASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/06/01
Vol. E84-C  No. 6 ; pp. 734-739
Type of Manuscript:  Special Section PAPER (Special Issue on Nonvolatile Memories)
Category: Flash Memories
Keyword: 
ie-FlashEPROMfuse and redundancy
 Summary | Full Text:PDF

Optical Beam Induced Current Technique as a Failure Analysis Tool of EPROMs
Jun SATOH Hiroshi NAMBA Tadashi KIKUCHI Kenichi YAMADA Hidetoshi YOSHIOKA Miki TANAKA Ken SHONO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 574-578
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
data retention failureEMSEPROMfailure analysisOBIC
 Summary | Full Text:PDF

A Specific Design Approach for Automotive Microcomputers
Nobusuke ABE Shozo SHIROTA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/12/25
Vol. E76-C  No. 12 ; pp. 1788-1793
Type of Manuscript:  Special Section PAPER (Special Issue on ASICs for Automotive Electronics)
Category: 
Keyword: 
automotive microcomputerhigh reliabilityhigh qualityEPROM
 Summary | Full Text:PDF

Statistical Memory Yield Analysis and Redundancy Design Considering Fabrication Line Improvement
Ken-ichi IMAMIYA Jun-ichi MIYAMOTO Nobuaki OHTSUKA Naoto TOMITA Yumiko IYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Vol. E76-C  No. 11 ; pp. 1626-1631
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memories)
Category: Non-volatile Memory
Keyword: 
redundancymemoryyieldEPROM
 Summary | Full Text:PDF