Keyword : EM-parameters

Further Study on Coaxial-Probe-Based Two-Thickness-Method for Nondestructive and Broadband Measurement of Complex EM-parameters of Absorbing Material
Chun-Ping CHEN Deming XU Zhewang MA Tetsuo ANADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/09/01
Vol. E90-C  No. 9 ; pp. 1763-1769
Type of Manuscript:  Special Section PAPER (Special Section on Microwave and Millimeter-Wave Technology)
Category: Passive Devices/Circuits
coaxial probetwo-thickness-methodabsorbing materialEM-parameterspermittivitypermeabilityuncertainty
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