Keyword : ECC


Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair
Gian MAYUGA Yuta YAMATO Tomokazu YONEDA Yasuo SATO Michiko INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/10/01
Vol. E99-D  No. 10 ; pp. 2591-2599
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
memory repairmemory reliabilityin-field test and repairECCin-field repair strategyremapping
 Summary | Full Text:PDF(2.4MB)

A Design Strategy of Error-Prediction Low-Density Parity-Check (EP-LDPC) Error-Correcting Code (ECC) and Error-Recovery Schemes for Scaled NAND Flash Memories
Shuhei TANAKAMARU Masafumi DOI Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/01/01
Vol. E98-C  No. 1 ; pp. 53-61
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
Error-correcting codeECClow-density parity-checkLDPCNAND flash memory
 Summary | Full Text:PDF(2.2MB)

A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip
Shoichiro KAWASHIMA Isao FUKUSHI Keizo MORITA Ken-ichi NAKABAYASHI Mitsuharu NAKAZAWA Kazuaki YAMANE Tomohisa HIRAYAMA Toru ENDO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/10/01
Vol. E90-C  No. 10 ; pp. 1941-1948
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Technology toward Frontiers of New Market)
Category: Next-Generation Memory for SoC
Keyword: 
FeRAMBGS2T2C-referenceFIPself-timingECCSmart Card
 Summary | Full Text:PDF(1.7MB)

Multilevel Storage in Phase-Change Memory
Yang HONG Yinyin LIN Ting-Ao TANG Bomy CHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/03/01
Vol. E90-C  No. 3 ; pp. 634-640
Type of Manuscript:  PAPER
Category: Storage Technology
Keyword: 
1T1R2T2RPCMmultilevel storageone-dimensional ratio spaceECC
 Summary | Full Text:PDF(568KB)

A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC
Hideyuki NODA Katsumi DOSAKA Hans Jurgen MATTAUSCH Tetsushi KOIDE Fukashi MORISHITA Kazutami ARIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/11/01
Vol. E89-C  No. 11 ; pp. 1612-1619
Type of Manuscript:  Special Section PAPER (Special Section on Novel Device Architectures and System Integration Technologies)
Category: 
Keyword: 
soft errorECCTCAMembeddedDRAM
 Summary | Full Text:PDF(1.2MB)