IEICE Trans

Keyword : ECC

Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair Gian MAYUGA Yuta YAMATO Tomokazu YONEDA Yasuo SATO Michiko INOUE
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2016/10/01 Vol. E99-D No. 10 ; pp. 2591-2599 Type of Manuscript: PAPER Category: Dependable Computing Keyword: memory repair, memory reliability, in-field test and repair, ECC, in-field repair strategy, remapping,
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A Design Strategy of Error-Prediction Low-Density Parity-Check (EP-LDPC) Error-Correcting Code (ECC) and Error-Recovery Schemes for Scaled NAND Flash Memories Shuhei TANAKAMARU Masafumi DOI Ken TAKEUCHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2015/01/01 Vol. E98-C No. 1 ; pp. 53-61 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: Error-correcting code, ECC, low-density parity-check, LDPC, NAND flash memory,
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A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip Shoichiro KAWASHIMA Isao FUKUSHI Keizo MORITA Ken-ichi NAKABAYASHI Mitsuharu NAKAZAWA Kazuaki YAMANE Tomohisa HIRAYAMA Toru ENDO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/10/01 Vol. E90-C No. 10 ; pp. 1941-1948 Type of Manuscript: Special Section PAPER (Special Section on VLSI Technology toward Frontiers of New Market) Category: Next-Generation Memory for SoC Keyword: FeRAM, BGS, 2T2C-reference, FIP, self-timing, ECC, Smart Card,
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Multilevel Storage in Phase-Change Memory Yang HONG Yinyin LIN Ting-Ao TANG Bomy CHEN
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/03/01 Vol. E90-C No. 3 ; pp. 634-640 Type of Manuscript: PAPER Category: Storage Technology Keyword: 1T1R, 2T2R, PCM, multilevel storage, one-dimensional ratio space, ECC,
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A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC Hideyuki NODA Katsumi DOSAKA Hans Jurgen MATTAUSCH Tetsushi KOIDE Fukashi MORISHITA Kazutami ARIMOTO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/11/01 Vol. E89-C No. 11 ; pp. 1612-1619 Type of Manuscript: Special Section PAPER (Special Section on Novel Device Architectures and System Integration Technologies) Category: Keyword: soft error, ECC, TCAM, embedded, DRAM,
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