Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits Yukiya MIURA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3 ;
pp. 564-570 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Fault Detection Keyword: bridging faults, CMOS synchronous sequential circuits, fault analysis, testing,
