Keyword : CMOS synchronous sequential circuits


Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 564-570
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
bridging faultsCMOS synchronous sequential circuitsfault analysistesting
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