Keyword : CMOS circuits


Design a Folded Mixer with High Conversion Gain for 2-11GHz WiMAX System
Zhi-Ming LIN Po-Yu KUO Zhong-Cheng SU 
Publication:   
Publication Date: 2017/02/01
Vol. E100-C  No. 2 ; pp. 204-210
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
Keyword: 
CMOS circuitsfolded mixerWiMAX systempower consumptionconversion gain
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A 0.18 µm Stability-Enhanced CMOS LDO with Robust Compensation Scheme
Hsuan-I PAN Chern-Lin CHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/08/01
Vol. E92-C  No. 8 ; pp. 1080-1086
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
CMOS circuitslinear regulatorcompensationstability
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Ramp Voltage Testing for Detecting Interconnect Open Faults
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 700-705
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword: 
CMOS circuitsdefect oriented testingopen faultsramp voltage
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Test Sequence Generation for Test Time Reduction of IDDQ Testing
Hiroyuki YOTSUYANAGI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 537-543
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
IDDQ testingbridging faultsswitching currentsupply current testCMOS circuits
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Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field
Hiroyuki YOTSUYANAGI Taisuke IWAKIRI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D  No. 12 ; pp. 2666-2673
Type of Manuscript:  Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword: 
open defectssupply current testCMOS circuitselectric field
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A CMOS 310MHz, 20dB Variable Gain Amplifier
Khayrollah HADIDI Abdollah KHOEI Mahta JENABI Hamed PEYRAVI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/05/01
Vol. E86-A  No. 5 ; pp. 1233-1239
Type of Manuscript:  PAPER
Category: Analog Signal Processing
Keyword: 
VGAPGAadjustable gainamplifiersCMOS circuits
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An IDDQ Sensor Driven by Abnormal IDDQ
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/10/25
Vol. E83-D  No. 10 ; pp. 1860-1867
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
built-in testingCMOS circuitsIDDQ sensor circuitsIDDQ testinglow-voltage ICs
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