| Keyword : CBCM
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Development of Test Structure for Variability Evaluation using Charge-Based Capacitance Measurement Katsuhiro TSUJI Kazuo TERADA Ryota KIKUCHI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2014/11/01
Vol. E97-C
No. 11 ;
pp. 1117-1123
Type of Manuscript:
PAPER
Category: Semiconductor Materials and Devices Keyword: MOSFET, C-V curve, CBCM, variability, | | Summary | Full Text:PDF | |
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