Keyword : C-V curve


Study on Threshold Voltage Variation Evaluated by Charge-Based Capacitance Measurement
Katsuhiro TSUJI Kazuo TERADA Ryo TAKEDA Hisato FUJISAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/04/01
Vol. E99-C  No. 4 ; pp. 466-473
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETC-V curveCBCMthreshold voltageflat-band voltagevariation
 Summary | Full Text:PDF

Development of Test Structure for Variability Evaluation using Charge-Based Capacitance Measurement
Katsuhiro TSUJI Kazuo TERADA Ryota KIKUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/11/01
Vol. E97-C  No. 11 ; pp. 1117-1123
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETC-V curveCBCMvariability
 Summary | Full Text:PDF