Keyword : BTI


Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs
Michitarou YABUUCHI Ryo KISHIDA Kazutoshi KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A  No. 12 ; pp. 2367-2372
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
BTIprocess variationreliability
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