Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-CNo. 5 ;
pp. 838-844 Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures) Category: Keyword: BSIM3, bulk effect, compact model, MOSFETs, radio frequency,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2000/03/25 Vol. E83-ANo. 3 ;
pp. 412-420 Type of Manuscript: Special Section PAPER (Special Section of Selected Papers from the 12th Workshop on Circuits and Systems in Karuizawa) Category: Keyword: high-voltage MOS, BSIM3, SPICE model,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/04/25 Vol. E82-CNo. 4 ;
pp. 630-637 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Keyword: high-voltage MOS, BSIM3, SPICE model,