Keyword : AFM


High-Sensitive Detection of Electronic Emission through Si-Nanocrystals/Si-Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy
Daichi TAKEUCHI Katsunori MAKIHARA Mitsuhisa IKEDA Seiichi MIYAZAKI Hirokazu KAKI Tsukasa HAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/05/01
Vol. E97-C  No. 5 ; pp. 397-400
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Si nano-columnar structureAFMcurrent imageelectron emission
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Characterization of Local Electronic Transport through Ultrathin Au/Highly-Dense Si Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy
Daichi TAKEUCHI Katsunori MAKIHARA Mitsuhisa IKEDA Seiichi MIYAZAKI Hirokazu KAKI Tsukasa HAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5 ; pp. 718-721
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Si nanocolumnar structureAFMcurrent imageelectron emission
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Study on Surface Characteristic of the Copper Nitride Films by Absorbed Oxygen
Musun KWAK Jongho JEON Kyoungri KIM Yoonseon YI Sangjin AN Donsik CHOI Youngseok CHOI Kyongdeuk JEONG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/11/01
Vol. E95-C  No. 11 ; pp. 1744-1748
Type of Manuscript:  INVITED PAPER (Special Section on Electronic Displays)
Category: 
Keyword: 
copper nitrideweak boundary layeroxygenatmospheric pressure plasmaexcimer ultravioletXPSAFM
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Fabrication and Device Simulation of Single Nano-Scale Organic Static Induction Transistors
Noboru OHASHI Masakazu NAKAMURA Norio MURAISHI Masatoshi SAKAI Kazuhiro KUDO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/12/01
Vol. E89-C  No. 12 ; pp. 1765-1770
Type of Manuscript:  Special Section PAPER (Special Section on Towards the Realization of Organic Molecular Electronics)
Category: Organic Molecular Devices
Keyword: 
organic SITnanostructuresAFMcolloidal lithographysemiconductor device simulation
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Characterization of Germanium Nanocrystallites Grown on SiO2 by a Conductive AFM Probe Technique
Katsunori MAKIHARA Yoshihiro OKAMOTO Hideki MURAKAMI Seiichiro HIGASHI Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C  No. 4 ; pp. 705-708
Type of Manuscript:  Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Nanomaterials and Quantum-Effect Devices
Keyword: 
nanocrystalAFMconducting probelocal characterization
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Alignment of Different Lengths of Carbon Nanotubes Using Low Applied Electric Field
Khalil EL-HAMI Kazumi MATSUSHIGE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/12/01
Vol. E87-C  No. 12 ; pp. 2116-2118
Type of Manuscript:  Special Section LETTER (Special Section on Recent Progress in Organic Molecular Electronics)
Category: Fabrication of Organic Nano-devices
Keyword: 
carbon nanotubesalignmentflexibilityAFM
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Nanoscale Investigation of Piezo and Leakage Defects in SBT Film by SPM
Mami SAITO Kumi OKUWADA Soichi NADAHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/06/01
Vol. E84-C  No. 6 ; pp. 802-807
Type of Manuscript:  Special Section PAPER (Special Issue on Nonvolatile Memories)
Category: FeRAMs
Keyword: 
AFMpiezo imageleakage current imageSrBi2Ta2O9sol-gel method
 Summary | Full Text:PDF

Wear Durability and Adhesion Evaluation Methods for Ultrathin Overcoat Films by Atomic Force Microscopy
Shigeru UMEMURA Shigeru HIRONO Yasuko ANDOH Reizo KANEKO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/03/25
Vol. E81-C  No. 3 ; pp. 337-342
Type of Manuscript:  Special Section PAPER (Special Issue on Electromechanical Devices and their Surface Science)
Category: 
Keyword: 
wearadhesionthin filmmicrotribologyAFM
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Stiffness of Measurement System and Significant Figures of Displacement which are Required to Interpret Adhesional Force Curves
Kunio TAKAHASHI Nancy A. BURNHAM Hubert M. POLLOCK Tadao ONZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/02/25
Vol. E80-C  No. 2 ; pp. 255-262
Type of Manuscript:  Special Section PAPER (Special Issue on Micromachine Technology)
Category: Actuator
Keyword: 
force curveAFMMuller-Yushchenko-Derjaguin (MYD)Johnson-Kendall-Roberts (JKR)Derjaguin-Muller-Toporov (DMT)adhesionelastic contactstiffnesscompliance
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Evaluation of Si Surface Micro-Roughness by Measuring Chlorine Concentration and Total Charge of Native Oxide
Ichiro OKI Tetsuo BIWA Jun KUDO Hikou SHIBAYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7 ; pp. 809-811
Type of Manuscript:  Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
AFMSTMmicro-roughnessHCl/H2O2
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