Keyword : ADC testing

Two-Tone Signal Generation for ADC Testing
Keisuke KATO Fumitaka ABE Kazuyuki WAKABAYASHI Chuan GAO Takafumi YAMADA Haruo KOBAYASHI Osamu KOBAYASHI Kiichi NIITSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/06/01
Vol. E96-C  No. 6 ; pp. 850-858
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
ADC testing, two-tone signal, intermodulation distortion, arbitrary waveform generator, ΣΔ DAC, digital pre-distortion, distortion shaping, 
 Summary | Full Text:PDF(5.2MB)
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
Kicheol KIM Youbean KIM Incheol KIM Hyeonuk SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4 ; pp. 670-672
Type of Manuscript:  LETTER
Category: Semiconductor Materials and Devices
Keyword: 
ADC testing, BIST, histogram testing, 
 Summary | Full Text:PDF(363.5KB)