Keyword : 256 Kbit

Soft-Error Immune 180-µm2 SICOS Upward Transistor Memory Cell for Ultra-High-Speed High-Density Bipolar RAMs
Youji IDEI Takeo SHIBA Noriyuki HOMMA Kunihiko YAMAGUCHI Tohru NAKAMURA Takahiro ONAI Youichi TAMAKI Yoshiaki SAKURAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/11/25
Vol. E75-C  No. 11 ; pp. 1369-1376
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memories)
Category: 
Keyword: 
soft error, SICOS, bipolar RAM, 256 Kbit, 
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