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Keyword : 256 Kbit
Soft-Error Immune 180-µm
2
SICOS Upward Transistor Memory Cell for Ultra-High-Speed High-Density Bipolar RAMs
Youji IDEI
Takeo SHIBA
Noriyuki HOMMA
Kunihiko YAMAGUCHI
Tohru NAKAMURA
Takahiro ONAI
Youichi TAMAKI
Yoshiaki SAKURAI
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
1992/11/25
Vol.
E75-C
No.
11
;
pp.
1369-1376
Type of Manuscript:
Special Section PAPER (Special Issue on LSI Memories)
Category:
Keyword:
soft error
,
SICOS
,
bipolar RAM
,
256 Kbit
,
Summary
|
Full Text:PDF