Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D
No. 3 ;
pp. 771-775
Type of Manuscript:
Special Section LETTER (Special Section on Test and Verification of VLSIs)
Category: Keyword: post-BIST fault diagnosis, multiple stuck-at faults, combinational circuits, pass/fail information, |