Keyword : X-bit


A New Method for Low-Capture-Power Test Generation for Scan Testing
Xiaoqing WEN Yoshiyuki YAMASHITA Seiji KAJIHARA Laung-Terng WANG Kewal K. SALUJA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/05/01
Vol. E89-D  No. 5 ; pp. 1679-1686
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testingcapture powerX-bitIR-drop
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