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| Keyword : S-parameters
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Scalable Short-Open-Interconnect S-Parameter De-Embedding Method for On-Wafer Microwave Characterization of Silicon MOSFETs
Ming-Hsiang CHO Yueh-Hua WANG Lin-Kun WU | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2007/09/01
Vol. E90-C
No. 9 ;
pp. 1708-1714
Type of Manuscript:
Special Section PAPER (Special Section on Microwave and Millimeter-Wave Technology)
Category: Active Devices/Circuits
Keyword:
calibration, de-embedding, CMOS, microwave, parasitics, S-parameters, | | | Summary | Full Text:PDF(1.7MB) | |
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