Scalable Short-Open-Interconnect S-Parameter De-Embedding Method for On-Wafer Microwave Characterization of Silicon MOSFETs Ming-Hsiang CHOYueh-Hua WANGLin-Kun WU
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/09/01 Vol. E90-CNo. 9 ;
pp. 1708-1714 Type of Manuscript: Special Section PAPER (Special Section on Microwave and Millimeter-Wave Technology) Category: Active Devices/Circuits Keyword: calibration, de-embedding, CMOS, microwave, parasitics, S-parameters,