Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D
No. 7 ;
pp. 697-705
Type of Manuscript:
Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Fault Diagnosis
Keyword:
fault diagnosis, transistor leakage fault, IDDQ, primary output, fault simulation, diagnostic test generation, |
