Keyword : I-V characteristics


I-V Characteristic of YBCO Step-Edge Josephson Junction
Keiichi YAMAGUCHI Shuichi YOSHIKAWA Tsuyoshi TAKENAKA Syuichi FUJINO Kunihiko HAYASHI Tsutomu MITSUZUKA Katsumi SUZUKI Youichi ENOMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/25
Vol. E77-C  No. 8 ; pp. 1218-1223
Type of Manuscript:  Special Section PAPER (Special Section on Superconducting Devices)
Category: HTS
Keyword: 
Josephson junctionhigh Tc superconductorI-V characteristicsdevice application
 Summary | Full Text:PDF

Evaluation of Surface Damage on a Silicon Wafer Induced by Reactive Ion Etching Using X-Ray Photoeloctron Spectroscopy and Electrical Characteristics
Akitaka MURATA Morio NAKAMURA Akira ASAI Ichiro TANIGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/09/25
Vol. E75-C  No. 9 ; pp. 990-994
Type of Manuscript:  Special Section PAPER (Special Issue on Silicon Devices and Materials)
Category: 
Keyword: 
XPSI-V characteristicsRIE with CF4 gassurface damageSiF3CDE with NF3 gas
 Summary | Full Text:PDF