Keyword : IDDQ


On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies
Xiaoqing WEN Seiji KAJIHARA Hideo TAMAMOTO Kewal K. SALUJA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/04/01
Vol. E88-D  No. 4 ; pp. 703-710
Type of Manuscript:  PAPER
Category: Computer Components
Keyword: 
fault diagnosisIDDQtransistor leakage fault modelmultiple power supplycircuit partitioning
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