Keyword : γ-ray


Reliability of Low-Noise HEMTs under Gamma-Ray Irradiation
Yasunobu SAITO Fumio SASAKI Hisao KAWASAKI Hiroshi ISHIMURA Hirokuni TOKUDA Motoharu OHTOMO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/09/25
Vol. E76-C  No. 9 ; pp. 1379-1383
Type of Manuscript:  Special Section PAPER (Special Issue on Heterostructure Electron Devices)
Category: 
Keyword: 
reliabilityHEMTγ-raydegradation
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