IEICE TRANSACTIONS on Electronics

Archive Index

Online ISSN : 1745-1353
Volume E103-C No.5  (Publication Date:2020/05/01)
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Special Section on Recent Progress in Superconductor Sensors and Detectors for Cutting-Edge Technologies

pp.197-197  FOREWORD  Open Access Paper
FOREWORD
Hiroaki MYOREN  
Summary | FreeFull Text:PDF(79.5KB)

pp.198-203  INVITED PAPER-Superconducting Electronics  Open Access Paper
Superconducting Neutron Detectors and Their Application to Imaging
Takekazu ISHIDA  
Summary | FreeFull Text:PDF(655.7KB)

pp.204-211  INVITED PAPER-Superconducting Electronics  Open Access Paper
Niobium-Based Kinetic Inductance Detectors for High-Energy Applications
Masato NARUSE  Masahiro KUWATA  Tomohiko ANDO  Yuki WAGA  Tohru TAINO  Hiroaki MYOREN  
Summary | FreeFull Text:PDF(3.6MB)

pp.212-215  BRIEF PAPER-Superconducting Electronics
Development and Evaluation of Superconducting Nanowire Single-Photon Detectors for 900-1100 nm Photon Detection
Fumihiro CHINA  Shigehito MIKI  Masahiro YABUNO  Taro YAMASHITA  Hirotaka TERAI  
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Regular Section

pp.216-224  PAPER-Microwaves, Millimeter-Waves
Contrast Enhancement of 76.5 GHz-Band Millimeter-Wave Images Using Near-Field Scattering for Non-Destructive Detection of Concrete Surface Cracks
Akihiko HIRATA  Makoto NAKASHIZUKA  Koji SUIZU  Yoshikazu SUDO  
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pp.225-230  PAPER-Microwaves, Millimeter-Waves
Broadband RF Power Amplifier with Combination of Large Signal X-Parameter and Real Frequency Techniques
Ragavan KRISHNAMOORTHY  Narendra KUMAR  Andrei GREBENNIKOV  Binboga Siddik YARMAN  Harikrishnan RAMIAH  
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pp.231-237  PAPER-Electronic Circuits
Implementation of a 16-Phase 8-Branch Charge Pump with Advanced Charge Recycling Strategy
Hui PENG  Pieter BAUWENS  Herbert De PAUW  Jan DOUTRELOIGNE  
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pp.238-245  PAPER-Electromechanical Devices and Components
Non-Arcing Circuit Breaking Phenomena in Electrical Contacts due to Dark Bridge
Hiroyuki ISHIDA  
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pp.246-253  PAPER-Electromechanical Devices and Components
Identification and Sensing of Wear Debris Caused by Fretting Wear of Electrical Connectors
Yanyan LUO  Zhaopan ZHANG  Xiongwei WU  Jingyuan SU  
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pp.254-262  PAPER-Semiconductor Materials and Devices
Time Dependent Percolation Analysis of the Degradation of Coherent Tunneling in Ultra-Thin CoFeB/MgO/CoFeB Magnetic Tunneling Junctions
Keiji HOSOTANI  Makoto NAGAMINE  Ryu HASUNUMA  
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pp.263-273  PAPER-Integrated Electronics
A Highly Configurable 7.62GOP/s Hardware Implementation for LSTM
Yibo FAN  Leilei HUANG  Kewei CHEN  Xiaoyang ZENG  
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pp.274-278  BRIEF PAPER-Semiconductor Materials and Devices  Open Access Paper
A Novel Technique to Suppress Multiple-Triggering Effect in Typical DTSCRs under ESD Stress
Lizhong ZHANG  Yuan WANG  Yandong HE  
Summary | FreeFull Text:PDF(2.4MB)

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