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IEICE TRANSACTIONS on Electronics
0.35 1.3
Volume E77-C No.4  (Publication Date:1994/04/25)
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Special Issue on LSI Failure Analysis

pp.527-527  FOREWORD
FOREWORD
Shigeru NAKAJIMA  
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pp.528-534  INVITED PAPER
Failure Analysis in Si Device Chips
Kiyoshi NIKAWA  
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pp.535-545  INVITED PAPER
LSI Failure Analysis with CAD-Linked Electron Beam Test System and Its Cost Evaluation
Hiromu FUJIOKA  Koji NAKAMAE  
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pp.546-551  PAPER
Efficient Dynamic Fault Imaging by Fully Utilizing CAD Data in CAD-Linked Electron Beam Test System
Koji NAKAMAE  Hirohisa TANAKA  Hideharu KUBOTA  Hiromu FUJITA  
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pp.552-559  PAPER
E-Beam Static Fault Imaging with a CAD Interface and Its Application to Marginal Fault Diagnosis
Norio KUJI  Kiyoshi MATSUMOTO  
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pp.560-566  PAPER
Cone/Block Methods for Logic Simulation Time Reduction in E-Beam Guided-Probe Diagnosis
Norio KUJI  Kazuhiro SHIRAKAWA  
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pp.567-573  PAPER
Matching of DUT Interconnection Pattern with CAD Layout in CAD-Linked Electron Beam Test System
Koji NAKAMAE  Ryo NAKAGAKI  Katsuyoshi MIURA  Hiromu FUJIOKA  
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pp.574-578  PAPER
Optical Beam Induced Current Technique as a Failure Analysis Tool of EPROMs
Jun SATOH  Hiroshi NAMBA  Tadashi KIKUCHI  Kenichi YAMADA  Hidetoshi YOSHIOKA  Miki TANAKA  Ken SHONO  
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pp.579-584  PAPER
An Analysis of and a Method of Enhancing the Intensity of OBIRCH Signal for Defects Observation in VLSI Metal Interconnections
Naoki KAWAMURA  Tomoaki SAKAI  Masakazu SHIMAYA  
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pp.585-589  PAPER
Defect Detection of Passivation Layer by a Bias-Free Cu Decoration Method
Tetsuaki WADA  Shinji NAKANO  
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pp.590-594  PAPER
Microstructure Analysis Technique of Specific Area by Transmission Electron Microscopy
Yoshifumi HATA  Ryuji ETOH  Hiroshi YAMASHITA  Shinji FUJII  Yoshikazu HARADA  
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pp.595-600  PAPER
ESR Study of MOSFET Characteristics Degradation Mechanism by Water in Intermetal Oxide
Kazunari HARADA  Naoki HOSHINO  Mariko Takayanagi TAKAGI  Ichiro YOSHII  
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Regular Section

pp.601-607  PAPER-Integrated Electronics
A Proposal of New Multiple-Valued Mask-ROM Design
Yasushi KUBOTA  Shinji TOYOYAMA  Yoji KANIE  Shuhei TSUCHIMOTO  
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pp.608-614  PAPER-Integrated Electronics
Measuring AC Emitter and Base Series Resistances in Bipolar Transistors
Youichiro NIITSU  
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pp.615-623  PAPER-Electronic Circuits
Experimental Design of a 32-bit Fully Asynchronous Microprocessor (FAM)
Kyoung-Rok CHO  Kazuma OKURA  Kunihiro ASADA  
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pp.624-632  PAPER-Opto-Electronics
Taper-Shape Dependence of Tapered-Waveguide Traveling Wave Semiconductor Laser Amplifier (TTW-SLA)
Syamsul EL YUMIN  Kazuhiro KOMORI  Shigehisa ARAI  Giampaolo BENDELLI  
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pp.633-638  PAPER-Microwave and Millimeter Wave Technology
An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1GHz
Akira NAKAYAMA  Kazuya SHIMIZU  
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pp.639-646  PAPER-Electromagnetic Theory
Ray-Optical Techniques in Dielectric Waveguides
Masahiro HASHIMOTO  Hiroyuki HASHIMOTO  
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pp.647-649  LETTER-Electronic Circuits
4-2 Compressor with Complementary Pass-Transistor Logic
Youji KANIE  Yasushi KUBOTA  Shinji TOYOYAMA  Yasuaki IWASE  Shuhei TSUCHIMOTO  
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