Zhiqiang YOU


A Low Power Deterministic Test Using Scan Chain Disable Technique
Zhiqiang YOU Tsuyoshi IWAGAKI Michiko INOUE Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/06/01
Vol. E89-D  No. 6  pp. 1931-1939
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
low power testingfull scan testingdeterministic testscan chain disabletabu search algorithm
 Summary | Full Text:PDF(638.3KB)

Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths
Zhiqiang YOU Ken'ichi YAMAGUCHI Michiko INOUE Jacob SAVIR Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/08/01
Vol. E88-D  No. 8  pp. 1940-1947
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
design for testabilityRTL data pathbuilt-in self-testlow power testingtest scheduling
 Summary | Full Text:PDF(447.5KB)