Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2003/12/01 Vol. E86-ANo. 12pp. 3056-3062 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Timing Verification and Test Generation Keyword: reseeding, LFSR, BIST, test pattern generation,