Yuto FUTAMURA


Characterization of Electron Field Emission from Multiple-Stacking Si-Based Quantum Dots
Yuto FUTAMURA Katsunori MAKIHARA Akio OHTA Mitsuhisa IKEDA Seiichi MIYAZAKI 
Publication:   
Publication Date: 2019/06/01
Vol. E102-C  No. 6  pp. 458-461
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Si quantum dotsGe coreelectron field emissionmultiple-stacked structureelectric field concentration
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