Yuta KIMI


Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path
Go MATSUKAWA Yuta KIMI Shuhei YOSHIDA Shintaro IZUMI Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/06/01
Vol. E99-A  No. 6  pp. 1198-1205
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
single event effectsingle event upsetsoft error propagationlogical maskingtemporal masking
 Summary | Full Text:PDF

A Low-Latency DMR Architecture with Fast Checkpoint Recovery Scheme
Go MATSUKAWA Yohei NAKATA Yasuo SUGURE Shigeru OHO Yuta KIMI Masafumi SHIMOZAWA Shuhei YOSHIDA Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/04/01
Vol. E98-C  No. 4  pp. 333-339
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design---Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
dual modular redundancycheckpoint recoveryfault-tolerance
 Summary | Full Text:PDF

A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ×91 Failure Rate Improvement under 35% Supply Voltage Fluctuation
Yohei NAKATA Yuta KIMI Shunsuke OKUMURA Jinwook JUNG Takuya SAWADA Taku TOSHIKAWA Makoto NAGATA Hirofumi NAKANO Makoto YABUUCHI Hidehiro FUJIWARA Koji NII Hiroyuki KAWAI Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C  No. 4  pp. 332-341
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
design for robustnesscachevariation tolerance7T/14T SRAM
 Summary | Full Text:PDF