Yukiya SAKAKI


Reliability Analysis of Scaled NAND Flash Memory Based SSDs with Real Workload Characteristics by Using Real Usage-Based Precise Reliability Test
Yusuke YAMAGA Chihiro MATSUI Yukiya SAKAKI Ken TAKEUCHI 
Publication:   
Publication Date: 2018/04/01
Vol. E101-C  No. 4  pp. 243-252
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
solid-state drivereliabilityNAND flash memory
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