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Ramp Voltage Testing for Detecting Interconnect Open Faults Yukiya MIURA | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D
No. 3
pp. 700-705
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSIs) Category: Defect-Based Testing Keyword: CMOS circuits, defect oriented testing, open faults, ramp voltage, | | Summary | Full Text:PDF | |
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Testable Design for Stuck-Open Faults with the Robustness Yukiya MIURA Kozo KINOSHITA | Publication: IEICE TRANSACTIONS (1976-1990)
Publication Date: 1990/08/25
Vol. E73-E
No. 8
pp. 1294-1300
Type of Manuscript:
Special Section PAPER (Special Issue on Fault-Tolerant Systems) Category: Keyword:
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