Yukio MITSUYAMA


Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design and Its Irradiation Testing
Hiroaki KONOURA Dawood ALNAJJAR Yukio MITSUYAMA Hajime SHIMADA Kazutoshi KOBAYASHI Hiroyuki KANBARA Hiroyuki OCHI Takashi IMAGAWA Kazutoshi WAKABAYASHI Masanori HASHIMOTO Takao ONOYE Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A  No. 12  pp. 2518-2529
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
reconfigurable architecturesoft errorradiation testbehavioral synthesisstate machine
 Summary | Full Text:PDF

Comparative Evaluation of Lifetime Enhancement with Fault Avoidance on Dynamically Reconfigurable Devices
Hiroaki KONOURA Takashi IMAGAWA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7  pp. 1468-1482
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
fault avoidancelifetime enhancementmean-time-to-failure (MTTF)partial reconfiguration
 Summary | Full Text:PDF

SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects
Ryo HARADA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7  pp. 1461-1467
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
soft errorsingle event transient (SET)pulse-widthpulse-width modulationmeasurement circuitwithin-die process variation
 Summary | Full Text:PDF

NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time
Hiroaki KONOURA Toshihiro KAMEDA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7  pp. 1483-1491
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTINBTI mitigationperformance degradationscan pathagingreliability
 Summary | Full Text:PDF

Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
Toshihiro KAMEDA Hiroaki KONOURA Dawood ALNAJJAR Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/08/01
Vol. E96-D  No. 8  pp. 1624-1631
Type of Manuscript:  Special Section PAPER (Special Section on Reconfigurable Systems)
Category: Test and Verification
Keyword: 
field testfault avoidancecoarse-grained reconfigurable device
 Summary | Full Text:PDF

Stress Probability Computation for Estimating NBTI-Induced Delay Degradation
Hiroaki KONOURA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A  No. 12  pp. 2545-2553
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
NBTIstress probabilitytiming analysis
 Summary | Full Text:PDF

Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-Inverter-Delay Resolution
Ryo HARADA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A  No. 12  pp. 2417-2423
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
soft errorsingle event transient (SET)pulse widthmeasurement circuit
 Summary | Full Text:PDF

Trade-Off Analysis between Timing Error Rate and Power Dissipation for Adaptive Speed Control with Timing Error Prediction
Hiroshi FUKETA Masanori HASHIMOTO Yukio MITSUYAMA Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A  No. 12  pp. 3094-3102
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verfication
Keyword: 
adaptive speed controlsubthreshold circuittiming error predictiontiming margin variability
 Summary | Full Text:PDF

An Experimental Study on Body-Biasing Layout Style Focusing on Area Efficiency and Speed Controllability
Koichi HAMAMOTO Hiroshi FUKETA Masanori HASHIMOTO Yukio MITSUYAMA Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/02/01
Vol. E92-C  No. 2  pp. 281-285
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
body biaslayout
 Summary | Full Text:PDF

Area-Efficient Reconfigurable Architecture for Media Processing
Yukio MITSUYAMA Kazuma TAKAHASHI Rintaro IMAI Masanori HASHIMOTO Takao ONOYE Isao SHIRAKAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/12/01
Vol. E91-A  No. 12  pp. 3651-3662
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Embedded, Real-Time and Reconfigurable Systems
Keyword: 
reconfigurablemedia processingmulti-standardarea-efficiencydynamic reconfiguration
 Summary | Full Text:PDF

Architecture of IEEE802.11i Cipher Algorithms for Embedded Systems
Yukio MITSUYAMA Motoki KIMURA Takao ONOYE Isao SHIRAKAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/04/01
Vol. E88-A  No. 4  pp. 899-906
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 17th Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
IEEE802.11iWEPTKIPAES-CCMembedded systemlow hardware cost
 Summary | Full Text:PDF