Yukihiko SAKURAI


Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation
Kouji ICHIKAWA Yuki TAKAHASHI Yukihiko SAKURAI Takahiro TSUDA Isao IWASE Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/06/01
Vol. E91-C  No. 6  pp. 936-944
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
integrated circuitelectro magnetic interferenceon-chip monitorimmunity
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