Yoshio TAKAZAWA


An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM
Mitsuhiko IGARASHI Yuuki UCHIDA Yoshio TAKAZAWA Makoto YABUUCHI Yasumasa TSUKAMOTO Koji SHIBUTANI Kazutoshi KOBAYASHI 
Publication:   
Publication Date: 2021/11/01
Vol. E104-A  No. 11  pp. 1536-1545
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Systems)
Category: 
Keyword: 
local BTI variationRing-Oscillator7nm FinFETSRAM Vmin
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